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基于相位相干及dB幅值增强的全聚焦成像

Total focusing method imaging based on phase coherence and dB amplitude enhancement

  • 摘要: 为改善去噪后超声全聚焦成像中缺陷显示微弱的问题,文章将相位相干成像(Phase Coherence Imaging, PCI)、dB幅值增强(dB)与全聚焦算法(total focusing method, TFM)相结合,提高了图像精度并使图像中的缺陷更容易分辨。在COMSOL有限元软件中建立碳钢块模型,并在不同位置设置孔缺陷,研究不同探头参数对碳钢块的TFM、全聚焦-相位相干(TFM-PCI)和全聚焦-相位相干-dB幅值增强(TFM-PCI-dB)成像的影响,得出最优的探头参数,并在实验中比较TFM-均值去噪、全聚焦-dB幅值增强(TFM-dB)、TMF-PCI和TFM-PCI-dB成像在去噪和去伪像方面的效果。结果表明:对于TFM或相位相干成像,探头的频率越高成像精度越高,成像的细节信息越多;阵元间距对成像的精度影响不大;阵元数越多、阵元间距越大,则探头覆盖范围越大,图像信息将更全面。其中TFM-PCI-dB方法可以更好地去除图像中的噪声和伪像,同时能加强图像中缺陷处的幅值,使图像精度更高。仿真和实验结果表明,TFM-PCI-dB方法提升了检测精度,为高精度缺陷检测领域提供了思路,具有重要参考价值。

     

    Abstract: In order to address the issue of that weakly defects are displayed in ultrasonic total focusing imaging after denoising, phase-coherent imaging (PCI), dB amplitude enhancement (dB) and total focusing algorithm (TFM) are combined in this paper. This combination improves image accuracy and enhances the distinguishability of defects. A carbon steel block with hole defects at different positions is modeled using COMSOL finite element software, with which the effects of various probe parameters on total focusing (TFM) imaging, total focusing-phase coherent imaging (TFM-PCI), and total focusing-phase coherent-dB amplitude-enhanced imaging (TFM-PCI-dB) is studied. Denoising and artifact removal are evaluated for TFM-mean denoising, total focus-dB amplitude-enhanced (TFM-dB), TMF-PCI, and TFM-PCI-dB imaging. The results indicate that: higher frequency probes yield greater imaging accuracy and more detailed information for both TFM and phase coherent imaging; array element spacing has minimal impact on accuracy ; increasing the number of array elements and their spacing expands probe coverage, resulting in more comprehensive image information. Among these methods, TFM-PCI-dB is demonstrated superior noise reduction capabilities while enhancing defect visibility, leading to higher image accuracy. Simulation and experimental results indicate that the TFM-PCI-dB method improves the detection accuracy and provides ideas for the field of high-precision defect detection.

     

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